Rahil Daman
at Arak Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 May 2008 Paper
Proceedings Volume 6995, 699513 (2008) https://doi.org/10.1117/12.782592
KEYWORDS: Image quality, Lab on a chip, Error analysis, Imaging arrays, Neodymium, MATLAB, Calibration, Moire patterns, Physics, Data processing

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