Prof. Rainer Tutsch
at Technische Univ Braunschweig
SPIE Involvement:
Conference Program Committee | Conference Co-Chair | Author | Editor
Publications (23)

SPIE Journal Paper | 25 August 2020
OE Vol. 59 Issue 08

SPIE Journal Paper | 3 March 2020
OE Vol. 59 Issue 03
KEYWORDS: Modulation transfer functions, Sensors, Monte Carlo methods, Lenses, Spatial frequencies, Cameras, Error analysis, Collimators, Optical engineering, Tolerancing

Proceedings Article | 5 May 2012 Paper
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Gold, Confocal microscopy, Refractive index, Optical sensors, Silica, Interferometers, Silicon, Optical testing, Photoresist materials, Aluminum

SPIE Journal Paper | 1 October 2011
OE Vol. 50 Issue 10
KEYWORDS: Cameras, 3D metrology, Sensors, Imaging systems, Binary data, Mirrors, Projection systems, Raster graphics, Illumination engineering, Photogrammetry

Proceedings Article | 27 May 2011 Paper
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Microlens array, Sensors, Silicon, Wavefront sensors, Microlens, Charge-coupled devices, Optical alignment, CCD image sensors, Semiconducting wafers, Signal detection

Showing 5 of 23 publications
Proceedings Volume Editor (8)

SPIE Conference Volume | 17 November 2008

SPIE Conference Volume | 8 October 2007

SPIE Conference Volume | 12 October 2006

SPIE Conference Volume | 5 December 2005

Showing 5 of 8 publications
Conference Committee Involvement (28)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Chiba, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Showing 5 of 28 Conference Committees
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