Ralph Petersen
at Univ der Bundeswehr Hamburg
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 4 November 2003 Paper
Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505684
KEYWORDS: Atomic force microscopy, Scanning probe microscopy, Actuators, Interferometers, Calibration, Head, Data acquisition, Sensors, Metrology, Mirrors

Proceedings Article | 11 November 2002 Paper
Proceedings Volume 4779, (2002) https://doi.org/10.1117/12.451749
KEYWORDS: Atomic force microscopy, Calibration, Scanning probe microscopy, Actuators, Standards development, Control systems, Prototyping, Interferometers, Head, Data storage

Proceedings Article | 26 September 2000 Paper
Proceedings Volume 4100, (2000) https://doi.org/10.1117/12.401663
KEYWORDS: Actuators, Control systems, Mathematical modeling, Scanning probe microscopy, Atomic force microscopy, Microsystems, Head, Optimization (mathematics), Nanotechnology, Optics manufacturing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top