Dr. Ralph Seulin Profile

Dr. Ralph Seulin

at Univ de Bourgogne

SPIE Involvement:

Author

Publications (20)

Proceedings Article | 14 May 2017 Open Access

An omni-RGB+D camera rig calibration and fusion using unified camera model for 3D reconstruction (Withdrawal Notice)

Ahmad Zawawi Jamaluddin, Osama Mazhar, Cansen Jiang, Ralph Seulin, Olivier Morel, David Fofi

Proceedings Volume 10338, 1033809 (2017) https://doi.org/10.1117/12.2266945

KEYWORDS: Cameras, Calibration, Stereoscopic cameras, Image fusion, Imaging systems, Detection and tracking algorithms, Optical spheres, Distortion, Spherical lenses, Refractor telescopes

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Proceedings Article | 30 April 2015 Paper

Online fully automated three-dimensional surface reconstruction of unknown objects

Souhaiel Khalfaoui, Antoine Aigueperse, Yohan Fougerolle, Ralph Seulin, David Fofi

Proceedings Volume 9534, 95340Z (2015) https://doi.org/10.1117/12.2182863

KEYWORDS: 3D modeling, 3D acquisition, Data acquisition, 3D metrology, Scanners, Robotics, Data modeling, Sensors, Optical spheres, Reverse modeling

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Proceedings Article | 30 January 2012 Paper

Fully automatic 3D digitization of unknown objects using progressive data bounding box

Souhaiel Khalfaoui, Antoine Aigueperse, Ralph Seulin, Yohan Fougerolle, David Fofi

Proceedings Volume 8290, 829011 (2012) https://doi.org/10.1117/12.909164

KEYWORDS: 3D modeling, Scanners, Solid modeling, Data acquisition, 3D acquisition, Sensors, Data modeling, Inspection, Computer aided design, Visibility

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Proceedings Article | 29 January 2010 Paper

Fully automatic 3D digitization of unknown objects

Gabriel Rozenwald, Ralph Seulin, Yohan Fougerolle

Proceedings Volume 7538, 753807 (2010) https://doi.org/10.1117/12.838887

KEYWORDS: 3D modeling, Model-based design, Scanners, Data modeling, 3D acquisition, Head, 3D image processing, Data acquisition, Robotics, Ranging

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Proceedings Article | 3 February 2009 Paper

A simulation of automatic 3D acquisition and post-processing pipeline

Arsalan Malik, Benjamin Loriot, Youssef Bokhabrine, Patrick Gorria, Ralph Seulin

Proceedings Volume 7251, 72510P (2009) https://doi.org/10.1117/12.806148

KEYWORDS: 3D modeling, Scanners, 3D acquisition, Solid modeling, Sensors, Model-based design, Computer aided design, 3D image processing, Data modeling, 3D scanning

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Proceedings Article | 3 February 2009 Paper

3D reconstruction of hot metallic surfaces for industrial part characterization

Youssef Bokhabrine, Lew Lew Yan Voon, Ralph Seulin, Patrick Gorria, Miguel Gomez, Daniel Jobard

Proceedings Volume 7251, 725107 (2009) https://doi.org/10.1117/12.806015

KEYWORDS: Clouds, Scanners, Laser scanners, 3D metrology, Head, Laser systems engineering, 3D modeling, Visualization, Temperature metrology, Laser development

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SPIE Journal Paper | 1 July 2008

Measurement of three-dimensional mirror parameters by polarization imaging applied to catadioptric camera calibration

Olivier Morel, Ralph Seulin, David Fofi

JEI, Vol. 17, Issue 03, 031105, (July 2008) https://doi.org/10.1117/12.10.1117/1.2958290

KEYWORDS: Mirrors, Calibration, 3D image processing, Combined lens-mirror systems, Polarization, Sensors, Cameras, Imaging systems, Dielectric polarization, Sensor calibration

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Proceedings Article | 23 July 2007 Paper

3D acquisition and modeling for flint artefacts analysis

B. Loriot, Y. Fougerolle, C. Sestier, R. Seulin

Proceedings Volume 6618, 66180G (2007) https://doi.org/10.1117/12.726149

KEYWORDS: 3D modeling, 3D acquisition, 3D scanning, Mathematical modeling, Error analysis, 3D metrology, Edge detection, Manufacturing, Data modeling, Prototyping

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Proceedings Article | 29 May 2007 Paper

Simulation for an automation of 3D acquistion and post-processing

B. Loriot, R. Seulin, P. Gorria, F. Meriaudeau

Proceedings Volume 6356, 635604 (2007) https://doi.org/10.1117/12.736694

KEYWORDS: 3D acquisition, 3D modeling, Cultural heritage, Motion models, Machine vision, Scanners

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Proceedings Article | 29 May 2007 Paper

Measurement of the three-dimensional mirror parameters by polarization imaging applied to catadioptric camera calibration

Olivier Morel, Ralph Seulin, David Fofi

Proceedings Volume 6356, 635608 (2007) https://doi.org/10.1117/12.736711

KEYWORDS: Mirrors, Calibration, Polarization, Combined lens-mirror systems, Cameras, Sensors, 3D image processing, Dielectric polarization, Image segmentation, Sensor calibration

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Proceedings Article | 20 February 2007 Paper

Machine vision system for the inspection of reflective parts in the automotive industry

Ghislain Salis, Ralph Seulin, Olivier Morel, Fabrice Meriaudeau

Proceedings Volume 6503, 65030O (2007) https://doi.org/10.1117/12.713586

KEYWORDS: Light sources and illumination, Inspection, Image segmentation, Reflectivity, Defect detection, Image processing, Machine vision, Plating, Cameras, Binary data

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Proceedings Article | 17 February 2007 Paper

Toward an automation of 3D acquisition and post-processing of cultural heritage artefacts

B. Loriot, R. Seulin, P. Gorria, F. Meriaudeau

Proceedings Volume 6503, 65030B (2007) https://doi.org/10.1117/12.704912

KEYWORDS: 3D modeling, 3D acquisition, Scanners, Cultural heritage, Data modeling, Motion models, 3D scanning, Sensors, Data acquisition, Optical spheres

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Proceedings Article | 10 March 2006 Paper

Near-infrared imaging and structured light ranging for automatic catheter insertion

Vincent Paquit, Jeffery Price, Ralph Seulin, Fabrice Mériaudeau, Rubye Farahi, Kenneth Tobin, Thomas Ferrell

Proceedings Volume 6141, 61411T (2006) https://doi.org/10.1117/12.655326

KEYWORDS: Veins, Near infrared, 3D modeling, 3D image processing, Cameras, Skin, 3D acquisition, Light emitting diodes, Image processing, Structured light

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Proceedings Article | 24 February 2005 Paper

Low-cost system for ancient stamps range image acquisition

Edouard Thomas, David Fofi, Frederic Nicolier, Gilles Millon, Ralph Seulin

Proceedings Volume 5679, (2005) https://doi.org/10.1117/12.588901

KEYWORDS: Calibration, Cameras, Projection systems, Scanners, Image processing, Image segmentation, 3D image processing, Image analysis, 3D scanning, Image acquisition

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Proceedings Article | 3 May 2004 Paper

Complete machine vision solution for tube inspection in nuclear industry

Ralph Seulin, Yvon Voisin, David Fofi, Fabrice Meriaudeau

Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.526641

KEYWORDS: Machine vision, Inspection, Manufacturing, Electronic imaging, Image processing, Control systems, Time metrology, Oxidation

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Proceedings Article | 3 May 2004 Paper

Machine vision system for surface inspection on brushed industrial parts

Nicolas Bonnot, Ralph Seulin, Frederic Merienne

Proceedings Volume 5303, (2004) https://doi.org/10.1117/12.530683

KEYWORDS: Light sources and illumination, Inspection, Machine vision, Image processing, Image segmentation, Manufacturing, Defect detection, Cameras, Control systems, Scene classification

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Proceedings Article | 1 May 2003 Paper

Range image binarization: applications to wooden stamp analysis

Ralph Seulin, O. Morel, Gilles Millon, Frederic Nicolier

Proceedings Volume 5132, (2003) https://doi.org/10.1117/12.515045

KEYWORDS: Image processing, 3D acquisition, Image acquisition, 3D scanning, Printing, 3D image processing, Binary data, Laser scanners, Image analysis, Image quality

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Proceedings Article | 11 February 2002 Paper

Simulation process for the design and optimization of a machine vision system for specular surface inspection

Ralph Seulin, Nicholas Bonnot, Fred Merienne, Patrick Gorria

Proceedings Volume 4567, (2002) https://doi.org/10.1117/12.455250

KEYWORDS: Machine vision, Inspection, Light sources and illumination, Imaging systems, Image quality, 3D image processing, 3D metrology, Metrology, Defect detection, Image segmentation

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Proceedings Article | 4 April 2001 Paper

Dynamic lighting system for specular surface inspection

Ralph Seulin, Fred Merienne, Patrick Gorria

Proceedings Volume 4301, (2001) https://doi.org/10.1117/12.420913

KEYWORDS: Light sources and illumination, Inspection, Image segmentation, Machine vision, Image processing, Charge-coupled devices, Reflection, Visual process modeling, Reflectivity, Defect detection

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SPIE Journal Paper | 1 January 2001

Study of the imaging conditions and processing for the aspect control of specular surfaces

Gaetan Delcroix, Ralph Seulin, Bernard Lamalle, Patrick Gorria, Fred Merienne

JEI, Vol. 10, Issue 01, (January 2001) https://doi.org/10.1117/12.10.1117/1.1314333

KEYWORDS: Light sources and illumination, Image processing, Defect detection, Reflectivity, Cameras, Inspection, Image filtering, Chemical elements, Imaging systems, Sensors

Showing 5 of 20 publications

Conference Committee Involvement (9)

Image Processing: Machine Vision Applications VIII

10 February 2015 | San Francisco, California, United States

Image Processing: Machine Vision Applications VII

3 February 2014 | San Francisco, California, United States

Image Processing: Machine Vision Applications VI

5 February 2013 | Burlingame, California, United States

Image Processing: Machine Vision Applications V

25 January 2012 | Burlingame, California, United States

Image Processing: Machine Vision Applications IV

25 January 2011 | San Francisco Airport, California, United States

Showing 5 of 9 Conference Committees

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