Raphael Morency
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 4 March 2019 Presentation
Proc. SPIE. 10925, Photonic Instrumentation Engineering VI
KEYWORDS: Near infrared, Metrology, Birefringence, Cameras, Sensors, Silicon, Manufacturing, Semiconductor manufacturing, Flat panel displays, Mechanical engineering

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Metrology, Clocks, Interferometers, Error analysis, Spectrometers, Interferometry, Multiplexing, Time metrology, Semiconducting wafers, Space reconnaissance

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Wafer-level optics, Semiconductors, Fabry–Perot interferometers, Moire patterns, Metrology, Spectroscopy, Silicon, Interferometry, Free space optics, Semiconducting wafers

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