Remigijus Sliupas
CEO at OPTOMAN
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 November 2010 Paper
Proceedings Volume 7376, 737602 (2010) https://doi.org/10.1117/12.871049
KEYWORDS: Plasma, Silicon carbide, Dielectrics, Silicon, Refractive index, Second-harmonic generation, Absorption, Metals, Femtosecond phenomena, Titanium dioxide

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