Dr. Ren-Jay Kou
at ASML Taiwan Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 December 2009 Paper
Proceedings Volume 7520, 752025 (2009) https://doi.org/10.1117/12.837495
KEYWORDS: Source mask optimization, Scanners, Photomasks, Reticles, Diffractive optical elements, Double patterning technology, Etching, Lithography, Error analysis

Proceedings Article | 24 March 2009 Paper
Ren-Jay Kou, Reiner Jungblut, Jan Hauschild, Shih-En Tseng, Jason Shieh, Jim Chen, Alek Chen, Koen Schreel
Proceedings Volume 7272, 727240 (2009) https://doi.org/10.1117/12.816455
KEYWORDS: Scatterometry, Scanners, Metrology, Semiconducting wafers, Optical proximity correction, Systems modeling, Reticles, Lithography, Time metrology, Scatter measurement

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