Dr. Renaud Bouffaron
at Institut Fresnel
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 May 2008 Paper
R. Bouffaron, L. Escoubas, J. Simon, Ph. Torchio, F. Flory, G. Berginc, Ph. Masclet, C. Perret, P. Schiavone
Proceedings Volume 6992, 69920H (2008) https://doi.org/10.1117/12.781357
KEYWORDS: Antireflective coatings, Reflectivity, Infrared radiation, Silicon, Finite-difference time-domain method, Silica, Thin film coatings, Optical properties, Photonic crystals, Solar cells

Proceedings Article | 15 May 2008 Paper
Jarkko Tuominen, Jussi Hiltunen, Antoine Wojdyla, Mikko Karppinen, Antti Suutala, Heli Jantunen, Renaud Bouffaron, Ludovic Escoubas
Proceedings Volume 6992, 69920B (2008) https://doi.org/10.1117/12.781151
KEYWORDS: Optical lithography, Photomasks, Waveguides, Nanoimprint lithography, Lithography, Silicon, Reactive ion etching, Nanolithography, Scanning electron microscopy, Holography

Proceedings Article | 7 June 2006 Paper
Proceedings Volume 6261, 626127 (2006) https://doi.org/10.1117/12.674683
KEYWORDS: Laser ablation, Chromium, Thin films, Visualization, Glasses, Metals, Ultrafast phenomena, Cameras, Femtosecond phenomena, Pulsed laser operation

Proceedings Article | 31 May 2006 Paper
Proceedings Volume 6263, 62630R (2006) https://doi.org/10.1117/12.677445
KEYWORDS: Chromium, Visualization, Plasma, Ultrafast phenomena, Laser ablation, Thin films, Glasses, Silicon, Scanning electron microscopy, Cameras

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