Dr. Renaud Stevens
at CEA-LETI MINATEC
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 19 May 2008 Paper
Proc. SPIE. 6997, Semiconductor Lasers and Laser Dynamics III
KEYWORDS: Wafer-level optics, Mirrors, Indium gallium arsenide, Quantum wells, Photonic crystals, Near field, Vertical cavity surface emitting lasers, Semiconducting wafers, Near field optics, Oxidation

Proceedings Article | 1 February 2008 Paper
Proc. SPIE. 6908, Vertical-Cavity Surface-Emitting Lasers XII
KEYWORDS: Wafer-level optics, Mirrors, Indium gallium arsenide, Quantum wells, Continuous wave operation, Waveguides, Photonic crystals, Vertical cavity surface emitting lasers, Semiconducting wafers, Oxidation

Proceedings Article | 23 February 2007 Paper
Proc. SPIE. 6484, Vertical-Cavity Surface-Emitting Lasers XI
KEYWORDS: Oxides, Indium gallium arsenide, Quantum wells, Continuous wave operation, Gallium arsenide, Quantum dots, Aluminum, Vertical cavity surface emitting lasers, Gallium, Oxidation

Proceedings Article | 21 April 2006 Paper
Proc. SPIE. 6185, Micro-Optics, VCSELs, and Photonic Interconnects II: Fabrication, Packaging, and Integration
KEYWORDS: Oxides, Optical fibers, Indium gallium arsenide, Quantum wells, Continuous wave operation, Gallium arsenide, Near field scanning optical microscopy, Vertical cavity surface emitting lasers, Semiconducting wafers, Near field optics

Proceedings Article | 10 February 2006 Paper
Proc. SPIE. 6132, Vertical-Cavity Surface-Emitting Lasers X
KEYWORDS: Oxides, Indium gallium arsenide, Quantum wells, Continuous wave operation, Waveguides, Gallium arsenide, Vertical cavity surface emitting lasers, Semiconducting wafers, Pulsed laser operation, Temperature metrology

Showing 5 of 9 publications
Conference Committee Involvement (1)
Vertical-Cavity Surface-Emitting Lasers XIII
28 January 2009 | San Jose, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top