Prof. Renjie Zhou
Associate Professor at Chinese Univ of Hong Kong
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Label-free optical imaging , Optical Diffraction Tomograhy , Quantitative Phase Microsocopy , Biomedical Optics , Laser Biomedicine , Laser Metrology
Websites:
Profile Summary

I work on advancing optical imaging techniques for material metrology and biomedical applications that can improve our human life. Particularly, I am developing precision measurement tools that can enable me to collaborate with researchers and engineers to solve fundamental and/or practical problems. I obtained my PhD degree from the Electrical and Computer Engineering Department at the University of Illinois at Urbana-Champaign (UIUC) in 2014. Immediately following that, I took a postdoc training at MIT until May 2017. Over the past 6 years, I have focused on developing physical imaging models and building laser interferometric imaging instruments for various applications.

Apart from research, I am very keen in promoting optical sciences and optical technologies to raise their awareness among the general public. I delivered about 20 research seminars at different universities over the past 2 years. As a recipient of SPIE Optics and Photonics Scholarship, I organized iOptics seminar series at UIUC. I also advocate interdisciplinary research subjects, for which reason I was awarded a Beckman Institute Fellowship from 2013-2014. To provide research opportunities for young people, over the past 5 years I have mentored over 10 undergraduates and 2 visiting students, which have helped most of them to find jobs and/or advanced to graduate studies.
Publications (55)

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12852, PC128520E (2024) https://doi.org/10.1117/12.3008495
KEYWORDS: Graphene, Profiling, Signal to noise ratio, Optical path differences, Film thickness, Silicon, Monolayers, Silicon films, Refractive index, Refraction

Proceedings Article | 13 March 2024 Poster
Proceedings Volume PC12852, PC128521Q (2024) https://doi.org/10.1117/12.3008497
KEYWORDS: Spatial resolution, Phase imaging, Image resolution, Imaging systems, Spectral resolution, Silicon, Semiconductors, Semiconducting wafers, Optoelectronics, Optical sensing

SPIE Journal Paper | 19 September 2023 Open Access
Yile Sun, Hongfei Zhu, Lu Yin, Hanmeng Wu, Mingxuan Cai, Weiyun Sun, Yueshu Xu, Xinxun Yang, Jiaxiao Han, Wenjie Liu, Yubing Han, Xiang Hao, Renjie Zhou, Cuifang Kuang, Xu Liu
AP, Vol. 5, Issue 05, 056007, (September 2023) https://doi.org/10.1117/12.10.1117/1.AP.5.5.056007
KEYWORDS: Fluorescence, 3D image processing, Light sources and illumination, Image restoration, Fluorescence imaging, Microscopy, Image resolution, Stereoscopy, 3D image reconstruction, Mitochondria

Proceedings Article | 19 April 2023 Presentation
Proceedings Volume PC12435, PC1243503 (2023) https://doi.org/10.1117/12.2648743
KEYWORDS: Tomography, Photopolymerization, Optical tomography, Diffraction, 3D metrology, Scanning electron microscopy, Atomic force microscopy, Structural design, Refractive index, Printing

Proceedings Article | 17 March 2023 Poster
Proceedings Volume PC12389, PC123890X (2023) https://doi.org/10.1117/12.2648788
KEYWORDS: Phase retrieval, Network architectures, Signal attenuation, Computer programming, Signal to noise ratio, Phase imaging, Performance modeling, Neural networks, Demodulation

Showing 5 of 55 publications
Conference Committee Involvement (14)
Quantitative Phase Imaging XI
25 January 2025 | San Francisco, United States
Emerging Digital Micromirror Device Based Systems and Applications XVII
25 January 2025 | San Francisco, United States
Holography, Diffractive Optics, and Applications XIV
12 October 2024 | Nantong, Jiangsu, China
Emerging Digital Micromirror Device Based Systems and Applications XVI
30 January 2024 | San Francisco, California, United States
Quantitative Phase Imaging X
27 January 2024 | San Francisco, California, United States
Showing 5 of 14 Conference Committees
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