Reza Sahraeian
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 November 2024 Presentation + Paper
Roy Anunciado, Konstantin Nechaev, Reza Sahraeian, Jeroen Schouwenberg, Guillaume Schelcher, Shubhankar Das, Wei Peng, Stefan van der Sanden, Harm Dillen
Proceedings Volume 13215, 1321508 (2024) https://doi.org/10.1117/12.3034649
KEYWORDS: Design, Logic, Optical proximity correction, Critical dimension metrology, Logic devices

Proceedings Article | 10 April 2024 Presentation + Paper
Proceedings Volume 12955, 129550O (2024) https://doi.org/10.1117/12.3010421
KEYWORDS: Semiconducting wafers, Overlay metrology, Cross validation, Process control, Logic, Metrology, Simulations, Scanning electron microscopy, Lithography

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