Dr. Richard L. Lozes
Principal Consultant at Lozes Technology Consulting
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 December 2002 Paper
Thomas Newman, Ira Finklestein, Huei-Mei Kao, Sriram Krishnaswami, Darryn Long, Richard Lozes, Henry Pearce-Percy, Allan Sagle, Jeffrey Varner, Stacey Winter, Mark Gesley, Frank Abboud
Proceedings Volume 4889, (2002) https://doi.org/10.1117/12.468198
KEYWORDS: Photomasks, Beam shaping, Optical proximity correction, Raster graphics, Modulation, Electron beam lithography, Optical lithography, Chemically amplified resists, Calibration, Lithography

Proceedings Article | 1 July 1991 Open Access Paper
Steven Dunbrack, Andrew Muray, Charles Sauer, Richard Lozes, John Nistler, William Arnold, David Kyser, Anna Maria Minvielle, Moshe Preil, Bhanwar Singh, Michael Templeton
Proceedings Volume 1464, (1991) https://doi.org/10.1117/12.44444
KEYWORDS: Photomasks, Inspection, Reticles, Integrated circuits, Process control, Metrology, Electron beam lithography, Phase shifts, Overlay metrology, Photomicroscopy

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