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Richard Schueller
Scientist at American Science and Engineering Inc
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Publications (2)
Proceedings Article | 26 November 2002 Paper
Compact high-energy x-ray inspection systems for screening air cargo
William Sapp, Lee Grodzins, Peter Rothschild, Richard Schueller
Proceedings Volume 4786, (2002) https://doi.org/10.1117/12.451329
KEYWORDS: Inspection, X-rays, Beam shaping, Backscatter, Imaging systems, Prototyping, X-ray imaging, Environmental sensing, Image segmentation, Sensors
Proceedings Article | 18 December 2000 Paper
New low-dose 1-MeV cargo inspection system with backscatter imaging
William Sapp, Peter Rothschild, Richard Schueller, Andrey Mishin
Proceedings Volume 4142, (2000) https://doi.org/10.1117/12.410560
KEYWORDS: Inspection, X-rays, Imaging systems, Backscatter, X-ray sources, X-ray imaging, X-ray detectors, Digital x-ray imaging, Spatial resolution
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