Mr. Rick K. Dorval Profile

Rick K. Dorval

CTO at Safran Optics 1

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Author

Publications (6)

Proceedings Article | 22 March 2005 Paper

Spatial 3D infrastructure: display-independent software framework, high-speed rendering electronics, and several new displays

Won-Suk Chun, Joshua Napoli, Oliver Cossairt, Rick Dorval, Deirdre Hall, Thomas Purtell, James Schooler, Yigal Banker, Gregg Favalora

Proc. SPIE. 5664, Stereoscopic Displays and Virtual Reality Systems XII

KEYWORDS: Electronics, 3D applications, Visualization, Projection systems, Digital micromirror devices, 3D displays, 3D image processing, 3D volumetric displays, Software frameworks, OpenGL

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Proceedings Article | 28 August 2002 Paper

100-million-voxel volumetric display

Gregg Favalora, Joshua Napoli, Deirdre Hall, Rick Dorval, Michael Giovinco, Michael Richmond, Won Chun

Proc. SPIE. 4712, Cockpit Displays IX: Displays for Defense Applications

KEYWORDS: Human-machine interfaces, Mirrors, Visualization, Spatial light modulators, Projection systems, Digital micromirror devices, 3D displays, 3D image processing, 3D volumetric displays

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Proceedings Article | 22 June 2001 Paper

Volumetric three-dimensional display system with rasterization hardware

Gregg Favalora, Rick Dorval, Deirdre Hall, Michael Giovinco, Joshua Napoli

Proc. SPIE. 4297, Stereoscopic Displays and Virtual Reality Systems VIII

KEYWORDS: Electronics, Digital signal processing, Visualization, Projection systems, Raster graphics, 3D displays, 3D image processing, 3D volumetric displays, OpenGL

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Proceedings Article | 10 February 1995 Paper

Offset scanning and field widening: maintaining the radiometric performance of a Fourier transform spectrometer (FTS) with high spectral discrimination capability

James Engel, Rick Dorval

Proc. SPIE. 2366, Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements

KEYWORDS: Signal to noise ratio, Mirrors, Modulation, Interferometers, Sensors, Spectrometers, Fourier transforms, Wavefronts, Feature extraction, Spectral resolution

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Proceedings Article | 17 October 1994 Paper

Fourier transform spectrometer (FTS) systems with diode-based referencing and autoalignment capabilities

James Engel, Rick Dorval

Proc. SPIE. 2269, Infrared Technology XX

KEYWORDS: Infrared sensors, Mirrors, Interferometers, Sensors, Spectroscopy, Fourier transforms, Semiconductor lasers, Detector arrays, Infrared technology, Helium neon lasers

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Showing 5 of 6 publications

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