Dr. Rob W. van der Heijden
Associate Professor at Technische Univ Eindhoven
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 5 March 2021 Presentation
Luca Picelli, Anne van Klinken, Gustav Lindgren, Kaylee Hakkel, Francesco Pagliano, Petrus van Veldhoven, Rob van der Heijden, Andrea Fiore
Proceedings Volume 11695, 116950B (2021) https://doi.org/10.1117/12.2577630
KEYWORDS: Sensors, Refractive index, Photonic crystals, Fiber optics sensors, Structured optical fibers, Spatial resolution, Semiconductors, Optical sensors, Optical fibers, Environmental sensing

Proceedings Article | 19 September 2017 Presentation
Maurangelo Petruzzella, Simone Birindelli, Francesco Pagliano, Daniele Pellegrino, Zarko Zobenica, Michele Cotrufo, Frank W. van Otten, Rob van der Heijden, Lianhe Li, Edmund Linfield, Andrea Fiore
Proceedings Volume 10358, 103580Q (2017) https://doi.org/10.1117/12.2277707
KEYWORDS: Single photon, Photonic crystals, Quantum dots, Light emitting diodes, Bosons, Integrated optics, Photons, Quantum efficiency, Quantum optics, Photonic integrated circuits

Proceedings Article | 26 July 2016 Presentation
Andrea Fiore, Zarko Zobenica, Rob van der Heijden, Maurangelo Petruzzella, Francesco Pagliano, Rick Leijssen, Ewold Verhagen, Tian Xia, Leonardo Midolo, YongJin Cho, Frank van Otten
Proceedings Volume 9884, 98840D (2016) https://doi.org/10.1117/12.2227615
KEYWORDS: Sensing systems, Photonic crystals, Nanophotonics, Optical sensing, Spectral resolution, Integrated optics, Waveguides, Atomic, molecular, and optical physics, Current controlled current source

SPIE Journal Paper | 29 March 2016
Young Seog Kang, Cedric Affentauschegg, Jan Mulkens, Jang-Sun Kim, Ju Hee Shin, Young Ha Kim, YoungSun Nam, Young-Sin Choi, Hunhwan Ha, Dong-Han Lee, Jae-il Lee, Umar Rizvi, Bernd Geh, Rob van der Heijden, Jan Baselmans, Oh-Sung Kwon
JM3, Vol. 15, Issue 02, 021403, (March 2016) https://doi.org/10.1117/12.10.1117/1.JMM.15.2.021403
KEYWORDS: Overlay metrology, Metrology, Distortion, Control systems, Semiconducting wafers, Scanners, Etching, Information technology, Image processing, Photomasks

Proceedings Article | 18 March 2015 Paper
Young-Seog Kang, Hunhwan Ha, Jang-Sun Kim, Ju Hee Shin, Young Ha Kim, Young Sun Nam, Young-Sin Choi, Cedric Affentauschegg, Rob van der Heijden, Umar Rizvi, Bernd Geh, Eric Janda, Jan Baselmans, Stefan van der Sanden, Oh-Sung Kwon, Mariya Ponomarenko, Daan Slotboom
Proceedings Volume 9426, 942608 (2015) https://doi.org/10.1117/12.2086938
KEYWORDS: Overlay metrology, Distortion, Etching, Metrology, Image processing, Instrument modeling, Data modeling, Calibration, Photomasks, Measurement devices

Showing 5 of 15 publications
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