Proceedings Article | 1 May 2009
Proc. SPIE. 7300, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX
KEYWORDS: Sensors, 3D modeling, Image sensors, Performance modeling, Data modeling, Staring arrays, Ultraviolet radiation, Thermal modeling, Signal to noise ratio, Nonuniformity corrections
Next Generation EO/IR Sensors using Nanostructures are being developed for a variety of Defense
Applications. In addition, large area IRFPA's are being developed on low cost substrates. In this paper, we will discuss
the capabilities of a EO/IR Sensor Model to provide a robust means for comparing performance of infrared FPA's and
Sensors that can operate in the visible and infrared spectral bands that coincide with the atmospheric windows - UV,
Visible-NIR (0.4-1.8μ), SWIR (2.0-2.5μ), MWIR (3-5μ), and LWIR (8-14μ).
The model will be able to predict sensor performance and also functions as an assessment tool for single-color
and for multi-color imaging. The detector model can also characterize ZnO, Si, SiGe, InGaAs, InSb, HgCdTe and
Nanostructure based Sensors. The model can predict performance by also placing the specific FPA into an optical
system, evaluates system performance (NEI, NETD, MRTD, and SNR). This model has been used as a tool for
predicting performance of state-of-the-art detector arrays and nanostructure arrays under development. Results of the
analysis can be presented for various targets for each of the focal plane technologies for a variety of missions.
