Prof. Robert M. Weikle
Associate Professor at Univ of Virginia
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 14 May 2018 Presentation + Paper
Salinporn Kittiwatanakul, Noah Sauber, Mike Cyberey, Arthur Lichtenberger, Robert Weikle, Jiwei Lu
Proceedings Volume 10656, 106560A (2018) https://doi.org/10.1117/12.2304303
KEYWORDS: Thin films, Sputter deposition, Temperature sensors

Proceedings Article | 5 September 2014 Paper
Souheil Nadri, Rebecca Percy, Lin Kittiwatanakul, Alex Arsenovic, Jiwei Lu, Stu Wolf, Robert Weikle
Proceedings Volume 9199, 91990C (2014) https://doi.org/10.1117/12.2060899
KEYWORDS: Photomasks, Vanadium, Antennas, Imaging systems, Calibration, Sapphire, Coded apertures, Switching, Mirrors, Modulation

Proceedings Article | 31 May 2013 Paper
R. Weikle, N. S. Barker, A. Lichtenberger, M. Bauwens
Proceedings Volume 8716, 87160Q (2013) https://doi.org/10.1117/12.2019784
KEYWORDS: Waveguides, Calibration, Silicon, Scattering, Semiconducting wafers, Micromachining, Channel waveguides, Etching, Antennas, Terahertz radiation

Proceedings Article | 18 May 2005 Paper
Robert Weikle, Zhiyang Liu, Li Yang, Sadik Ulker, A. Lichtenberger
Proceedings Volume 5790, (2005) https://doi.org/10.1117/12.603395
KEYWORDS: Reflectometry, Calibration, Waveguides, Sensors, Diodes, Phase measurement, Network security, Photography, Absorption, Microwave radiation

Proceedings Article | 19 January 2005 Paper
Robert Weikle, Zhiyang Liu, Heng Liu, Lei Liu, Sadik Ulker, Arthur Lichtenberger
Proceedings Volume 5592, (2005) https://doi.org/10.1117/12.571418
KEYWORDS: Sensors, Reflectometry, Calibration, Waveguides, Diodes, Phase measurement, Scattering, Scatter measurement, Bolometers, Photography

Showing 5 of 7 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top