Robin C. Sarma
Senior Product Engineer at Cadence Design Systems Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 6 December 2004 Paper
Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.572591
KEYWORDS: Photomasks, Semiconducting wafers, Manufacturing, Design for manufacturability, Reticles, Vestigial sideband modulation, Diagnostics, Failure analysis, Optical proximity correction, Resolution enhancement technologies

Proceedings Article | 3 May 2004 Paper
Michael Smayling, Robin Sarma, Toshiyuki Nagata, Narain Arora, Michael Duane, Shiany Oemardani, Santosh Shah
Proceedings Volume 5379, (2004) https://doi.org/10.1117/12.536027
KEYWORDS: Optical proximity correction, Resistance, Manufacturing, Semiconducting wafers, Resistors, Metals, Lithography, Scanners, Metrology, Photomasks

Proceedings Article | 3 May 2004 Paper
Robin Sarma, Michael Smayling, Narain Arora, Toshiyuki Nagata, Michael Duane, Santosh Shah, Harris Keston, Shiany Oemardani
Proceedings Volume 5379, (2004) https://doi.org/10.1117/12.536130
KEYWORDS: Photomasks, Manufacturing, Metals, Semiconducting wafers, Critical dimension metrology, Optical proximity correction, Resistance, Lithography, Dielectrics, Copper

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