Rong Xuan
at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 May 2008 Paper
G. Lin, C. Y. Chang, W. C. Tseng, C. P. Lee, K. F. Lin, R. Xuan, J. Y. Chi
Proceedings Volume 6997, 69970R (2008) https://doi.org/10.1117/12.781955
KEYWORDS: Laser damage threshold, Indium arsenide, Indium gallium arsenide, Gallium arsenide, Temperature metrology, Semiconductor lasers, Structural design, Cryogenics, Semiconductors, Cladding

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