Dr. Rudy Schlaf
Assistant Professor at Univ of South Florida
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 24 May 2004 Paper
Yusuf Emirov, J. Schumacher, B. Lagel, N. Nguyen, Zhifeng Ren, Zhongping Huang, Benjamin Rossie, Rudy Schlaf
Proceedings Volume 5375, (2004) https://doi.org/10.1117/12.563239
KEYWORDS: Electron beam lithography, Atomic force microscopy, Carbon nanotubes, Manufacturing, Plasma enhanced chemical vapor deposition, Code division multiplexing, Silicon, Semiconducting wafers, Ion beams, Scanning electron microscopy

Proceedings Article | 2 June 2003 Paper
Yusuf Emirov, M. Beerbom, Deron Walters, Z. Ren, Z. P. Huang, Benjamin Rossie, Rudy Schlaf
Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.483759
KEYWORDS: Carbon nanotubes, Code division multiplexing, Silicon, Manufacturing, Plasma enhanced chemical vapor deposition, Scanning probe metrology, Critical dimension metrology, Ion beams, Metals, Chromium

Proceedings Article | 16 July 2002 Paper
Rudy Schlaf, Yusuf Emirov, Jay Bieber, Arun Sikder, J. Kohlscheen, Deron Walters, Mohammed Islam, Bhavik Metha, Z. Ren, Terri Shofner, Benjamin Rossie, Michael Cresswell
Proceedings Volume 4689, (2002) https://doi.org/10.1117/12.473496
KEYWORDS: Code division multiplexing, Atomic force microscopy, Nickel, Carbon nanotubes, Manufacturing, Critical dimension metrology, Scanning probe metrology, Ion beams, Scanning electron microscopy, Plasma enhanced chemical vapor deposition

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