Rui He
at Xi'an Technological Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 November 2020 Paper
Proc. SPIE. 11569, AOPC 2020: Optical Information and Network
KEYWORDS: Visibility, Spatial coherence, Double patterning technology, Spiral phase plates, Near field, Interferometry, Distortion, Optical testing, Beam propagation method

SPIE Journal Paper | 16 July 2020
OE Vol. 59 Issue 07
KEYWORDS: Superposition, Speckle, Glasses, Speckle pattern, Optical engineering, Doppler effect, Statistical analysis, Beam shaping, Scattering

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