Russell A. Shoemake
Sr. Engineering Manager at Micron Technology Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2002 Paper
Proceedings Volume 4562, (2002) https://doi.org/10.1117/12.458318
KEYWORDS: Inspection, Etching, Thulium, Photomasks, Scanning electron microscopy, Calibration, Reflectivity, Defect inspection, Manufacturing, Dry etching

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