Prof. Ryszard Kisiel
at Warsaw University of Technology
SPIE Involvement:
Author | Editor
Publications (8)

Proceedings Article | 5 March 2022 Poster
Proceedings Volume PC12001, PC120011L (2022) https://doi.org/10.1117/12.2611724
KEYWORDS: Transistors, Field effect transistors, Iron, Gallium nitride, Etching, Silica, Resistance, Electronics, Silicon carbide, Semiconductor manufacturing

Proceedings Article | 25 July 2013 Paper
Marcin Mysliwiec, Marek Guziewicz, Ryszard Kisiel
Proceedings Volume 8902, 89020T (2013) https://doi.org/10.1117/12.2031286
KEYWORDS: Silver, Diodes, Silicon carbide, Ceramics, Temperature metrology, Glasses, Particles, Resistance, Copper, Scanning electron microscopy

Proceedings Article | 25 July 2013 Open Access Paper
Proceedings Volume 8902, 890202 (2013) https://doi.org/10.1117/12.2033297
KEYWORDS: Photonics, Sensors, Manufacturing, Transistors, Microsystems, Analytical research, Electronic components, Integrated circuits, Graphene, Field effect transistors

Proceedings Article | 12 October 2006 Paper
Proceedings Volume 6347, 63471U (2006) https://doi.org/10.1117/12.714551
KEYWORDS: Adhesives, Polymers, Silver, Resistance, Particles, Metals, Independent component analysis, Copper, Epoxies, Manufacturing

Proceedings Article | 12 October 2006 Paper
K. Kiełbasiński, J. Kalenik, R. Kisiel
Proceedings Volume 6347, 63471V (2006) https://doi.org/10.1117/12.714554
KEYWORDS: Silver, Resistance, Dendrites, Copper, Printed circuit board testing, Humidity, Microscopes, Electrodes, Lead, Metals

Showing 5 of 8 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 25 July 2013

Conference Committee Involvement (2)
Electron Technology Conference 2013
16 April 2013 | Ryn, Poland
Laser Technology 2012: Applications of Lasers
24 September 2012 | Szczecin, Poland
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