Dr. Ryutaro Maeda
at AIST
SPIE Involvement:
Author
Publications (51)

Proceedings Article | 17 September 2012 Paper
Yuichiro Ezoe, Teppei Moriyama, Tomohiro Ogawa, Takuya Kakiuchi, Takaya Ohashi, Ikuyuki Mitsuishi, Kazuhisa Mitsuda, Mitsuhiro Horade, Susumu Sugiyama, Raul Riveros, Hitomi Yamaguchi, Yoshiaki Kanamori, Kohei Morishita, Kazuo Nakajima, Ryutaro Maeda
Proceedings Volume 8443, 84430U (2012) https://doi.org/10.1117/12.925811
KEYWORDS: X-ray optics, X-rays, Wafer-level optics, Semiconducting wafers, Silicon, Microelectromechanical systems, Spatial resolution, Mirrors, Coating, Metals

SPIE Journal Paper | 1 July 2009
JM3, Vol. 8, Issue 03, 033010, (July 2009) https://doi.org/10.1117/12.10.1117/1.3158617
KEYWORDS: X-rays, Photomasks, Polymethylmethacrylate, X-ray lithography, Silicon, Scanning electron microscopy, X-ray technology, Nickel, X-ray imaging, Self-assembled monolayers

Proceedings Article | 30 April 2009 Paper
Ikuyuki Mitsuishi, Yuichiro Ezoe, Utako Takagi, Makoto Mita, Raul Riveros, Hitomi Yamaguchi, Fumiki Kato, Susumu Sugiyama, Kouzou Fujiwara, Kohei Morishita, Kazuo Nakajima, Shinya Fujihira, Yoshiaki Kanamori, Noriko Yamasaki, Kazuhisa Mitsuda, Ryutaro Maeda
Proceedings Volume 7360, 73600C (2009) https://doi.org/10.1117/12.823933
KEYWORDS: X-rays, Mirrors, Silicon, X-ray optics, Microelectromechanical systems, X-ray technology, Nickel, Semiconducting wafers, Hydrogen, Wafer-level optics

Proceedings Article | 24 July 2008 Paper
Yuichiro Ezoe, Tomotaka Yoshino, Kazuma Mukai, Hiroshi Yoshitake, Hiroki Akamatsu, Kumi Ishikawa, Takayuki Takano, Ryutaro Maeda, Yoshitaka Ishisaki, Noriko Yamasaki, Kazuhisa Mitsuda, Takaya Ohashi
Proceedings Volume 7021, 70211X (2008) https://doi.org/10.1117/12.788155
KEYWORDS: Gold, Silicon, X-rays, Etching, Deep reactive ion etching, X-ray astronomy, Semiconducting wafers, Sensors, X-ray technology, Photoresist materials

Proceedings Article | 11 January 2008 Paper
Masaaki Ichiki, Harumi Furue, Takeshi Kobayashi, Yasushi Morikawa, Kazuhiro Nonaka, Ryutaro Maeda
Proceedings Volume 6800, 680011 (2008) https://doi.org/10.1117/12.760416
KEYWORDS: Photovoltaics, Electrodes, Crystals, Microelectromechanical systems, Optical sensors, Semiconductors, Lead, Scanning electron microscopy, Optical properties, Ferroelectric materials

Showing 5 of 51 publications
Conference Committee Involvement (1)
Micromachining and Microfabrication
30 March 1999 | Paris, France
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