Dr. Sabatino Nacson
CTO at Teknoscan Systems Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 29 May 2014 Paper
Anthony Faust, Sabatino Nacson, Bruce Koffler, Éric Bourbeau, Louis Gagne, Robin Laing, C. Anderson
Proceedings Volume 9073, 90730V (2014) https://doi.org/10.1117/12.2058035
KEYWORDS: Explosives, X-rays, X-ray imaging, Defense and security, Inspection, Potassium, Image analysis, Crystals, Explosives detection, Safety

Proceedings Article | 17 February 1997 Paper
Sabatino Nacson, H. Walker, Allan Chang, Tony Siu, L. McNelles, M. Uffe
Proceedings Volume 2937, (1997) https://doi.org/10.1117/12.266765
KEYWORDS: Ionization, Ions, Sensors, Particles, Molecules, Natural surfaces, Signal processing, Platinum, Spectroscopy, Statistical analysis

Proceedings Article | 6 October 1994 Paper
Sabatino Nacson, Otto Legrady, Tony Siu, Dov Greenberg, Sam Nargolwalla, Prot Geblewicz
Proceedings Volume 2276, (1994) https://doi.org/10.1117/12.189201
KEYWORDS: Explosives, Sensors, Explosives detection, Inspection, Sulfur, LCDs, Molecules, NOx, Potassium, Metals

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