Prof. Sai Peng Wong Profile

Prof. Sai Peng Wong

Professor at Chinese Univ of Hong Kong

SPIE Involvement:

Author

Proceedings Article | 20 December 2006 Paper

Structural and magnetic properties of cobalt implanted TiO2 thin films

W. Y. Luk, S. P. Wong, N. Ke, Q. Li, J. K. N. Lindner

Proceedings Volume 6415, 64150M (2006) https://doi.org/10.1117/12.695191

KEYWORDS: Cobalt, Annealing, Chemical species, Magnetism, Thin films, Ions, Oxygen, Transmission electron microscopy, Image filtering, Oxides

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Proceedings Article | 21 December 2005 Paper

Ion beam synthesis of WC-SiC nanocomposite thin layers and their electron field emission properties

W. M. Tsang, S. P. Wong, J. K. N. Lindner

Proceedings Volume 6037, 603702 (2005) https://doi.org/10.1117/12.638686

KEYWORDS: Silicon carbide, Nanocomposites, Carbon, Atomic force microscopy, Annealing, Dielectrics, Tungsten, Ion beams, Silicon, Ions

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Proceedings Article | 23 February 2005 Paper

Structures and light emission properties of ion beam synthesized FeSi2 in silicon

C. Chow, Y. Gao, S. Wong, N. Ke, Q. Li, W. Cheung, G. Shao, M. Lourenco, K. Homewood

Proceedings Volume 5650, (2005) https://doi.org/10.1117/12.582335

KEYWORDS: Silicon, Electroluminescence, Annealing, Transmission electron microscopy, Ion beams, Iron, Molybdenum, Luminescence, Liquid crystal on silicon, Ions

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Proceedings Article | 8 December 2004 Paper

Thermal stability of metal containing diamond-like carbon thin film fabricated by dual plasma deposition

Ricky Fu, Y. Mei, M. Fu, C. Wei, G. Siu, Paul Chu, W. Cheung, S. Wong

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607377

KEYWORDS: Metals, Carbon, Plasma, Annealing, Molybdenum, Thin films, Raman scattering, Silicon, X-ray diffraction, Silicon carbide

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Proceedings Article | 2 April 2004 Paper

Ferromagnetism in transition metal-implanted titanium dioxide films

Sai-Peng Wong, Yun Gao, Kai Hon Cheng, Chi Fai Chow, Ning Ke, Wing Yiu Cheung, Quan Li, Guo Sheng Shao

Proceedings Volume 5276, (2004) https://doi.org/10.1117/12.530435

KEYWORDS: Cobalt, Chemical species, Fermium, Frequency modulation, Iron, Magnetism, Annealing, Thin films, Transmission electron microscopy, Ions

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Proceedings Article | 30 May 2003 Paper

Low-level birefringence detection system for stress measurement in semiconductors

Haijing Peng, Sai-peng Wong, Xiang Hua Liu, Yiu Wai Lai, Ho-pui Ho, Shounan Zhao

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.500420

KEYWORDS: Birefringence, Silicon, Semiconducting wafers, Signal detection, Photoelasticity, Sensors, Modulation, Semiconductors, Polarizers, Amplifiers

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Proceedings Article | 10 August 1998 Paper

Spectroellipsometric study of diamondlike carbon films

Wensheng Guo, Saipeng Wong, Ziqing Zhu

Proceedings Volume 3558, (1998) https://doi.org/10.1117/12.318355

KEYWORDS: Carbon, Silicon, Statistical analysis, Spectroscopic ellipsometry, Visible radiation, Spectroscopy, Diamond, Optical properties, Dielectrics, Backscatter

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Proceedings Article | 10 August 1998 Paper

Spectroellipsometric study of optical and electrical properties of buried CoSi2 layers in silicon produced by MEVVA implantation

Wensheng Guo, Saipeng Wong, Ziqing Zhu

Proceedings Volume 3558, (1998) https://doi.org/10.1117/12.318354

KEYWORDS: Silicon, Optical properties, Oscillators, Statistical modeling, Dielectrics, Amorphous silicon, Cobalt, Ions, Spectroscopic ellipsometry, Crystals

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Proceedings Article | 10 August 1998 Paper

Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantation

Wensheng Guo, Ziqing Zhu, Saipeng Wong

Proceedings Volume 3558, (1998) https://doi.org/10.1117/12.318356

KEYWORDS: Silicon carbide, Annealing, Silicon, Statistical modeling, Carbon, Amorphous silicon, Optical properties, Heterojunctions, Ions, Near infrared

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Proceedings Article | 10 April 1995 Paper

Stable properties of Ti:sapphire laser

Xu Huang, Wing-Kee Lee, Saipeng Wong, Shi Zhang, Zhenxin Yu

Proceedings Volume 2379, (1995) https://doi.org/10.1117/12.206505

KEYWORDS: Mirrors, Resonators, Monochromatic aberrations, Spherical lenses, Sapphire lasers, Laser crystals, Solid state lasers, Analytical research, Crystals, Matrices

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Proceedings Article | 26 October 1994 Paper

Characteristics and distributions of interface trap for novel SiOxNy thin dielectric film material

P. Chen, Saipeng Wong

Proceedings Volume 2364, (1994) https://doi.org/10.1117/12.190799

KEYWORDS: Interfaces, Dielectrics, Nitrogen, Thin films, Silicon, Semiconducting wafers, Very large scale integration, Resistance, Reliability, Polishing

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Showing 5 of 11 publications

Conference Committee Involvement (4)

Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems III

11 December 2006 | Adelaide, Australia

Device and Process Technologies for Microelectronics, MEMS, and Photonics IV

12 December 2005 | Brisbane, Australia

Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II

13 December 2004 | Sydney, Australia

Device and Process Technologies for Microelectronics, MEMS, and Photonics

10 December 2003 | Perth, Australia

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