Same-Ting Chen
Section Manager at Taiwan Semiconductor Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 August 2003 Paper
Same-Ting Chen, Tzy-Ying Lin, Chue-San Yoo
Proceedings Volume 5130, (2003) https://doi.org/10.1117/12.504063
KEYWORDS: Gallium, Photomasks, Critical dimension metrology, Quartz, Polymers, Transmittance, Binary data, Etching, Ion beams, Semiconducting wafers

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