Dr. Sandra Jacobi Profile

Dr. Sandra Jacobi

at GKSS Forschungszentrum

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 30 August 2005 Paper

Radiation damage to amorphous-carbon optical coatings

L. Juha, M. Bittner, M. De Grazia, J. Feldhaus, J. Gaudin, S. Guizard, S. Jacobi, M. Kozlova, J. Krasa, J. Krzywinski, H. Merdji, C. Michaelsen, T. Mocek, R. Nietubyc, M. Jurek, J. Polan, A. Prag, B. Rus, R. Sobierajski, B. Steeg-Keitel, M. Stoermer, M. Stupka, V. Vorlicek, J. Wiesmann, J. Wild

Proceedings Volume 5917, 59170F (2005) https://doi.org/10.1117/12.617125

KEYWORDS: Raman spectroscopy, Optical coatings, Atomic force microscopy, Free electron lasers, Extreme ultraviolet, Zinc, Carbon, Optical components, Vacuum ultraviolet, Mirrors

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Proceedings Article | 18 October 2004 Paper

Investigations of large x-ray optics for free electron lasers

Michael Stormer, Audrey Liard-Cloup, Frank Felten, Sandra Jacobi, Barbara Steeg, Josef Feldhaus, Rudiger Bormann

Proceedings Volume 5533, (2004) https://doi.org/10.1117/12.559619

KEYWORDS: Carbon, Free electron lasers, X-ray optics, Mirrors, Optical coatings, Reflectivity, Silicon, X-rays, Reflectometry, Silicon carbide

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Proceedings Article | 24 December 2002 Paper

Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers

Sandra Jacobi, Barbara Steeg, Jorg Wiesmann, Michael Stormer, Josef Feldhaus, Rüdiger Bormann, Carsten Michaelsen

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.450460

KEYWORDS: Carbon, Mirrors, Free electron lasers, Reflectivity, X-rays, Atomic force microscopy, Extreme ultraviolet, Reflectometry, Sputter deposition, Chemical vapor deposition

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Proceedings Article | 28 December 2001 Paper

Development of thin-film total-reflection mirrors for the XUV FEL

Sandra Jacobi, Joerg Wiesmann, Barbara Steeg, Josef Feldhaus, Carsten Michaelsen

Proceedings Volume 4500, (2001) https://doi.org/10.1117/12.452974

KEYWORDS: Carbon, Reflectivity, Argon, Free electron lasers, Mirrors, X-rays, Reflectometry, Silicon carbide, Sputter deposition, Extreme ultraviolet

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