Dr. Saulius Nevas
at Aalto Univ School of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2004 Paper
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Transmittance, Thin films, Refractive index, Spectrophotometry, Polarization, Collimation, Optical testing, Reflectivity, Refraction, Absorption

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