Seiji Hamano
at Panasonic Factory Solutions Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 October 2002 Paper
Seiji Hamano, Noriaki Yukawa, Tsuyoshi Nomura
Proceedings Volume 4902, (2002) https://doi.org/10.1117/12.469140
KEYWORDS: 3D metrology, Sensors, 3D image processing, Axicons, Laser systems engineering, Laser development, Image processing, Speckle, Laser applications, Laser processing

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