Dr. Sergey N. Yarishev
at ITMO Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Photodetectors, Visualization, Cameras, Sensors, Video, Interference (communication), Power supplies, Light sources and illumination, Temperature metrology

Proceedings Article | 29 April 2016 Paper
Proc. SPIE. 9897, Real-Time Image and Video Processing 2016
KEYWORDS: Visualization, Imaging systems, Cameras, Image processing, Error analysis, Computing systems, Control systems, Distortion, Optical tracking, Video processing, Chemical elements, Algorithm development

Proceedings Article | 22 June 2015 Paper
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Image segmentation, Image processing, Video, Error analysis, Computer programming, Image quality, Signal processing, Televisions, Video compression, Quantization

Proceedings Article | 22 June 2015 Paper
Proc. SPIE. 9530, Automated Visual Inspection and Machine Vision
KEYWORDS: MATLAB, Optical spheres, Cameras, Calibration, Image segmentation, Distortion, 3D modeling, Panoramic photography, Spherical lenses, 3D image processing

Proceedings Article | 22 June 2015 Paper
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Optical filters, Refractive index, Receivers, Control systems, Optoelectronics, Image sensors, Image filtering, Error control coding, Temperature metrology, RGB color model

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