Mr. Seth Wieman Profile

Seth Wieman

at Space Sciences Ctr

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Author

Publications (5)

Proceedings Article | 21 September 2015 Paper

Investigation of contamination of thin-film aluminum filters by MMH-NTO plumes exposed to UV radiation

Vaibhav Gupta, Seth Wieman, Leonid Didkovsky, Ralf Haiges, Yuhan Yao, Wei Wu, Mike Gruntman, Dan Erwin

Proceedings Volume 9604, 960408 (2015) https://doi.org/10.1117/12.2186812

KEYWORDS: Aluminum, Optical filters, Extreme ultraviolet, Contamination, Ultraviolet radiation, Scanning electron microscopy, Carbon, Thin films, Nitrogen, Oxidation

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Proceedings Article | 6 October 2011 Paper

Solar EUV Monitor (SEM) absolute irradiance measurements and how they are affected by choice of reference spectrum

Seth Wieman, Darrell Judge, Leonid Didkovsky

Proceedings Volume 8148, 81480G (2011) https://doi.org/10.1117/12.893163

KEYWORDS: Scanning electron microscopy, Extreme ultraviolet, Calibration, Solar processes, Rockets, Sensors, Data modeling, Ionization, Solar energy, Aerospace engineering

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Proceedings Article | 20 September 2007 Paper

A light-weight optics-free EUV spectrometer with substantially improved efficiency and spectral resolution

Leonid Didkovsky, Darrell Judge, Seth Wieman

Proceedings Volume 6689, 66890Q (2007) https://doi.org/10.1117/12.732879

KEYWORDS: Ionization, Sensors, Spectral resolution, Spectroscopy, Extreme ultraviolet, Electrons, Electrodes, Electron beams, Systems modeling, Rockets

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Proceedings Article | 20 September 2007 Paper

SDO EVE ESP radiometric calibration and results

Leonid Didkovsky, Darrell Judge, Seth Wieman, Tom Woods, Phil Chamberlin, Andrew Jones, Frank Eparvier, Matt Triplett, Don Woodraska, Don McMullin, Mitch Furst, Rob Vest

Proceedings Volume 6689, 66890P (2007) https://doi.org/10.1117/12.732868

KEYWORDS: Calibration, Extreme ultraviolet, Optical filters, Aluminum, Sensors, Visible radiation, Signal detection, Particles, Photodiodes, Synchrotrons

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Proceedings Article | 20 September 2007 Paper

A filter free dual transmission grating spectrometer for the extreme-ultraviolet

Seth Wieman, Leonid Didkovsky, Darrell Judge, Andrew Jones, Matthew Harmon

Proceedings Volume 6689, 66890R (2007) https://doi.org/10.1117/12.732953

KEYWORDS: Extreme ultraviolet, Sensors, Spectroscopy, Optical filters, Diffraction gratings, Diodes, Visible radiation, Optical testing, Thin films, Light sources

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