Seung-Hyun Choi
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 April 2012 Paper
Seung-Hyun Choi, Jae-Yeol Kim, Sung-Hyun kim, Chang-Hyun Kim
Proceedings Volume 8409, 84092X (2012) https://doi.org/10.1117/12.923341
KEYWORDS: Thermography, Ultrasonography, Nondestructive evaluation, Defect detection, Finite element methods, Infrared detectors, Infrared radiation, Inspection, Control systems, Cameras

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top