Prof. Seung-Woo Kim
Professor of Mechanical Engineering at KAIST
SPIE Involvement:
Author
Publications (69)

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Positioning equipment, Laser metrology, Optical systems engineering, Optical engineering, Optical systems, Distance measurement, 3D metrology

Proceedings Article | 3 September 2019 Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Distance measurement, 3D metrology, Signal detection, 3D acquisition, Detection and tracking algorithms, Optical tracking, Calibration, Retroreflectors, Algorithm development, Pulsed laser operation

Proceedings Article | 13 June 2017 Paper
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Spectroscopy, Femtosecond phenomena, Absorption, Semiconductor lasers, Spectral resolution, Remote sensing, Laser spectroscopy, Gases, Femtosecond fiber lasers, Fiber lasers

Proceedings Article | 16 March 2016 Paper
Proc. SPIE. 9754, Photonic Instrumentation Engineering III
KEYWORDS: Frequency combs, Metrology, Ultrafast lasers, Laser optics, Laser stabilization, Optical filters, Bragg cells, Interferometers, Fiber Bragg gratings, Signal to noise ratio

Proceedings Article | 15 March 2016 Paper
Proc. SPIE. 9739, Free-Space Laser Communication and Atmospheric Propagation XXVIII
KEYWORDS: Free space optics, Atmospheric optics, Frequency combs, Bragg cells, Signal to noise ratio, Singular optics, Channel projecting optics, Interference (communication), Feedback control, Heterodyning

Showing 5 of 69 publications
Conference Committee Involvement (12)
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Showing 5 of 12 Conference Committees
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