Shan Di
at Institute of Semiconductors CAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2013 Paper
Shan Di, Zhongxiang Cao, Yangfan Zhou, Nanjian Wu
Proceedings Volume 8908, 89082I (2013) https://doi.org/10.1117/12.2034994
KEYWORDS: 3D metrology, Photodiodes, 3D-TOF imaging, TCAD, Image sensors, CMOS sensors, Light sources, Time metrology, Distance measurement, Modulation

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