Dr. Shangkai Yu
at National Metrology Ctr
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2020 Presentation + Paper
Shihua Wang, Shengkai Yu
Proceedings Volume 11552, 1155204 (2020) https://doi.org/10.1117/12.2573316
KEYWORDS: Confocal microscopy, Microscopes, Metrology, Laser metrology, Microelectromechanical systems, Aerospace engineering, Manufacturing, Reflection, Feedback control, Additive manufacturing

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