Dr. Sheng-Yung Chen
Staff Engineer at PDF Solutions Inc
SPIE Involvement:
Author
Area of Expertise:
Nanolithography , Design for Manufacturability , Biomedical , Ultrasonics , Inter-vehicle communication
Publications (3)

Proceedings Article | 28 March 2017 Presentation + Paper
Chien-Lin Lee, Sheng-Wei Chien, Sheng-Yung Chen, Chun-Hung Liu, Kuen-Yu Tsai, Jia-Han Li, Bor-Yuan Shew, Chit-Sung Hong, Chao-Te Lee
Proceedings Volume 10145, 1014519 (2017) https://doi.org/10.1117/12.2257989
KEYWORDS: Metrology, Electron beam lithography, Lithography, Helium, Ion beams, Critical dimension metrology, Inspection, Photoresist processing, Optical lithography, Bridges

SPIE Journal Paper | 22 August 2012
JM3, Vol. 11, Issue 3, 033007, (August 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.3.033007
KEYWORDS: Electron beam lithography, Monte Carlo methods, Line edge roughness, Computer simulations, Critical dimension metrology, Transistors, Optical simulations, Diffusion, Optimization (mathematics), Point spread functions

Proceedings Article | 14 December 2009 Paper
Sheng-Yung Chen, Kuen-Yu Tsai, Hoi-Tou Ng, Chi-Hsiang Fan, Ting-Hang Pei, Chieh-Hsiung Kuan, Yung-Yaw Chen, Jia-Yush Yen
Proceedings Volume 7520, 75202K (2009) https://doi.org/10.1117/12.837048
KEYWORDS: Sensors, Monte Carlo methods, Electron beams, Signal detection, Lithography, Electron beam lithography, Detector arrays, Optical simulations, Semiconducting wafers, Silicon

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