Prof. Shien Ri Profile

Prof. Shien Ri

Chief Senior Researcher at National Industrial Science and Technology (AIST)

SPIE Involvement:

Author

Area of Expertise:

Optical Method , Moire Method , Experimental Mechanics , Phase Analysis

Publications (15)

Proceedings Article | 15 February 2024 Paper

Bridge deflection measurement by drone aerial photography using the sampling moiré method

Shien Ri, Jiaxing Ye, Peng Xia, Nobuyuki Toyama, Norihiko Ogura, Tomoki Shiotani

Proceedings Volume 13069, 130690O (2024) https://doi.org/10.1117/12.3023340

KEYWORDS: Bridges, Photography, Aerial cameras, Deformation, Phase measurement

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Proceedings Article | 22 May 2023 Presentation + Paper

Deflection measurement of bridges using drone aerial photography based on Moiré phase analysis methodology

Shien Ri, Jiaxing Ye, Qinghua Wang, Nobuyuki Toyama

Proceedings Volume 12327, 1232712 (2023) https://doi.org/10.1117/12.2644940

KEYWORDS: Digital cameras, Inspection, Video, Transportation, Phase distribution, Deformation

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SPIE Journal Paper | 22 October 2018

Sampling moiré as a special windowed Fourier ridges algorithm in demodulation of carrier fringe patterns

Qian Kemao, Nimisha Agarwal, Shien Ri, Qinghua Wang

OE, Vol. 57, Issue 10, 100503, (October 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.10.100503

KEYWORDS: Fringe analysis, Demodulation, Detection and tracking algorithms, Algorithms, Fourier transforms, Picosecond phenomena, Phase shifts, Error analysis, Optical engineering, Algorithm development

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Proceedings Article | 10 February 2017 Paper

Influence of working distance on microscale strain measurement under laser scanning microscope from moiré fringes

Qinghua Wang, Yosuke Takashita, Shien Ri, Hiroshi Tsuda, Ryuta Kitamura, Shinji Ogihara

Proceedings Volume 10250, 102501N (2017) https://doi.org/10.1117/12.2266697

KEYWORDS: Microscopes, Laser scanners

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Proceedings Article | 10 February 2017 Paper

Parallel computing for fast and accurate phase analysis of fringe pattern by two-dimensional phase shifting methods

Shien Ri, Qinghua Wang, Hiroshi Tsuda

Proceedings Volume 10250, 102502Q (2017) https://doi.org/10.1117/12.2266693

KEYWORDS: Fringe analysis, Phase shifts, Parallel computing, Image processing

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Proceedings Article | 17 July 2015 Paper

Deformation measurement of carbon fiber reinforced plastics using phase-shifting scanning electron microscope Moiré method after Fourier transform

Qinghua Wang, Shien Ri, Hiroshi Tsuda, Satoshi Kishimoto, Yoshihisa Tanaka, Yutaka Kagawa

Proceedings Volume 9524, 95240I (2015) https://doi.org/10.1117/12.2186145

KEYWORDS: Scanning electron microscopy, Phase shifting, Phase shifts, Fourier transforms, Moire patterns, Image filtering, Carbon, Electron microscopes, Image processing, Microscopes

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Proceedings Article | 17 July 2015 Paper

Simultaneous in-plane and out-of-plane displacement measurement based on a dual-camera imaging system and its application to inspection of large-scale space structures

Shien Ri, Hiroshi Tsuda, Takeshi Yoshida, Takashi Umebayashi, Akiyoshi Sato, Eiichi Sato

Proceedings Volume 9524, 95242N (2015) https://doi.org/10.1117/12.2190297

KEYWORDS: Cameras, Sensors, Imaging systems, Rockets, Aerospace engineering, Solids, Inspection, Digital cameras, Digital imaging, Reliability

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Proceedings Article | 22 June 2013 Paper

Two-dimensional sampling moiré method for fast and accurate phase analysis of single fringe pattern

Shien Ri, Hiroshi Tsuda

Proceedings Volume 8769, 87692C (2013) https://doi.org/10.1117/12.2018979

KEYWORDS: Fringe analysis, Signal to noise ratio, CCD cameras, Fourier transforms, Phase shifts, Cameras, Phase measurement, Camera shutters, Analytical research, 3D image processing

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Proceedings Article | 19 April 2013 Paper

Accurate and fast in-plane displacement measurement method for large-scale structures by utilizing repeated pattern

Shien Ri, Satoshi Hayashi, Shinji Ogihara, Hiroshi Tsuda

Proceedings Volume 8692, 86922F (2013) https://doi.org/10.1117/12.2008286

KEYWORDS: Image processing, Imaging systems, Fringe analysis, Sensors, Fourier transforms, Bridges, Digital image correlation, Cameras, Nondestructive evaluation, Digital imaging

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SPIE Journal Paper | 15 May 2012

Fast and accurate shape measurement system utilizing the fringe projection method with a ferroelectric liquid-crystal-on-silicon microdisplay

Shien Ri, Takashi Muramatsu, Masumi Saka, Hiroyuki Tanaka

OE, Vol. 51, Issue 8, 081506, (May 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.8.081506

KEYWORDS: Projection systems, Fringe analysis, Sensors, Phase shifts, LCDs, Imaging systems, Cameras, 3D metrology, Calibration, Time metrology

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SPIE Journal Paper | 1 October 2009

Single-shot three-dimensional shape measurement method using a digital micromirror device camera by fringe projection

Shien Ri, Motoharu Fujigaki, Yoshiharu Morimoto

OE, Vol. 48, Issue 10, 103605, (October 2009) https://doi.org/10.1117/12.10.1117/1.3250197

KEYWORDS: Digital micromirror devices, Cameras, Calibration, Charge-coupled devices, Mirrors, CCD cameras, Phase shifts, 3D image processing, 3D metrology, LCDs

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Proceedings Article | 6 December 2005 Paper

Development of DMD reflection-type CCD camera for phase analysis and shape measurement

Shien Ri, Yasuhiro Matsunaga, Motoharu Fujigaki, Toru Matui, Yoshiharu Morimoto

Proceedings Volume 6049, 60490I (2005) https://doi.org/10.1117/12.647938

KEYWORDS: Digital micromirror devices, Cameras, Charge-coupled devices, Mirrors, CCD cameras, Phase shifts, Moire patterns, Modulation transfer functions, Shape analysis, Camera shutters

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Proceedings Article | 6 December 2005 Paper

Omnidirectional shape measurement using reliability evaluation value in Fourier transform

Toru Matui, Shien Ri, Motoharu Fujigaki, Yoshiharu Morimoto

Proceedings Volume 6049, 60490F (2005) https://doi.org/10.1117/12.648709

KEYWORDS: Reliability, Cameras, Fourier transforms, Projection systems, CCD cameras, LCDs, Phase shifts, 3D image processing, Fringe analysis, 3D metrology

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SPIE Journal Paper | 1 August 2005

Phase reliability evaluation in phase-shifting method using Fourier transform for shape measurement

Shien Ri, Motoharu Fujigaki, Yoshiharu Morimoto

OE, Vol. 44, Issue 08, 083601, (August 2005) https://doi.org/10.1117/12.10.1117/1.2030907

KEYWORDS: Reliability, CCD cameras, Fourier transforms, Projection systems, Phase shifts, Fringe analysis, Cameras, Optical engineering, LCDs, Shape analysis

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Proceedings Article | 12 April 2005 Paper

Improvement of accuracy of shape measurement using DMD reflection-type CCD camera

Motoharu Fujigaki, Yoshiharu Morimoto, Shien Ri

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621663

KEYWORDS: Digital micromirror devices, Phase shifts, CCD cameras, Cameras, Charge-coupled devices, Mirrors, Micromirrors, Camera shutters, Moire patterns, Systems engineering

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Showing 5 of 15 publications

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