Shih-Lung Tsai
Project Manager at Macronix International Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 16 March 2009 Paper
Y. Y. Tsai, S. L. Tsai, Fred Lo, Elvis Yang, T. H. Yang, K. C. Chen, Chih-Yuan Lu
Proceedings Volume 7274, 727426 (2009) https://doi.org/10.1117/12.813461
KEYWORDS: Calibration, Data modeling, Scanning electron microscopy, Optical proximity correction, Image processing, Feature extraction, Error analysis, Wafer testing, Process modeling, Photomasks

Proceedings Article | 7 March 2008 Paper
S. L. Tsai, Fred Lo, Elvis Yang, T. H. Yang, K. C. Chen, C. Y. Lu
Proceedings Volume 6924, 69243X (2008) https://doi.org/10.1117/12.768625
KEYWORDS: Optical proximity correction, Calibration, Process modeling, Optical lithography, Photomasks, Photoresist materials, Systems modeling, Lithography, Mathematical modeling, Image transmission

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