Prof. Shing-Chung Wang
Professor at National Chiao Tung Univ
SPIE Involvement:
Track Chair | Author | Instructor
Publications (45)

Proceedings Article | 27 February 2015 Paper
Proc. SPIE. 9372, High Contrast Metastructures IV
KEYWORDS: Electron beam lithography, Finite-difference time-domain method, Polarization, Etching, Photonic crystals, Scanning electron microscopy, Gallium nitride, Photomasks, Electrical engineering, Photonic crystal devices

Proceedings Article | 27 February 2015 Paper
Proc. SPIE. 9372, High Contrast Metastructures IV
KEYWORDS: Reflectors, Optical design, Polarization, Etching, Silicon, Reflectivity, Scanning electron microscopy, Nanoimprint lithography, Vertical cavity surface emitting lasers, Silicon carbide

Proceedings Article | 27 February 2014 Paper
Proc. SPIE. 9001, Vertical-Cavity Surface-Emitting Lasers XVIII
KEYWORDS: Quantum wells, Light emitting diodes, Optical properties, Resistance, Gallium nitride, Numerical analysis, Aluminum nitride, Vertical cavity surface emitting lasers, Device simulation, Absorption

Proceedings Article | 19 February 2014 Paper
Proc. SPIE. 8995, High Contrast Metastructures III
KEYWORDS: Resonators, Polarization, Scattering, Ions, Reflectivity, Gallium nitride, Distributed Bragg reflectors, Finite element methods, Vertical cavity surface emitting lasers, Neodymium

Proceedings Article | 15 March 2013 Paper
Proc. SPIE. 8633, High Contrast Metastructures II
KEYWORDS: Resonators, Polarization, Scattering, Ions, Reflectivity, Electroluminescence, Gallium nitride, Vertical cavity surface emitting lasers, Neodymium, Electrophoretic light scattering

Showing 5 of 45 publications
Proceedings Volume Editor (12)

Showing 5 of 12 publications
Conference Committee Involvement (12)
Testing and Reliability of Optelectronic Devices
26 January 2001 | San Jose, CA, United States
Testing, Reliability, and Applications of Optoelectronic Devices
24 January 2001 | San Jose, CA, United States
Testing, Packaging, and Reliability of Semiconductors Lasers V
26 January 2000 | San Jose, CA, United States
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
25 January 2000 | San Jose, CA, United States
Testing, Packaging, Reliability, and Applications of SemiconductorLasers IV
28 January 1999 | San Jose, CA, United States
Showing 5 of 12 Conference Committees
Course Instructor
SC053: Testing and Reliability of Semiconductor Lasers
This course covers device physics, testing, lifetime and reliability evaluations of semiconductor lasers. The features of semiconductor lasers that are relevant to the device performance and reliability are briefly reviewed. Various laser characterization methods are described. Techniques for evaluation of laser lifetime and factors affecting laser reliability are discussed. Recent developments in semiconductor lasers are presented in the context of their impact on testing and reliability.
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