Shu-Fang Chen
at Taiwan Semiconductor Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 April 2013 Paper
Shu-Hao Chang, Shu-Fang Chen, Ying-Yu Chen, Ming-Chin Chien, Shang-Chieh Chien, Tzu-Lih Lee, Jack J. Chen, Anthony Yen
Proceedings Volume 8679, 86790O (2013) https://doi.org/10.1117/12.2010794
KEYWORDS: Contamination, Extreme ultraviolet, Extreme ultraviolet lithography, Lithography, Line width roughness, Semiconducting wafers, Scanners, Ruthenium, Polymers, Carbon

Proceedings Article | 19 March 2012 Paper
S. Chen, L. Chang, Y. Chang, C. Huang, C. Chang, Y. Ku
Proceedings Volume 8325, 83250O (2012) https://doi.org/10.1117/12.915802
KEYWORDS: Polymers, Diffusion, Line width roughness, Optics manufacturing, Scattering, Printing, Semiconductor manufacturing, Resolution enhancement technologies, Inspection, Immersion lithography

Proceedings Article | 30 March 2010 Paper
Proceedings Volume 7639, 76391A (2010) https://doi.org/10.1117/12.849449
KEYWORDS: Ultraviolet radiation, Polymers, Etching, Ozone, Photoresist processing, Semiconducting wafers, Natural surfaces, Lithography, Wet etching, Molecules

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