Dr. Shufeng Li
at Beijing Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 November 2018 Paper
Proceedings Volume 10964, 109643F (2018) https://doi.org/10.1117/12.2505945
KEYWORDS: Thin films, Crystals, Refractive index, Plasma, Optical properties, Quartz, Oscillators, Thin film deposition, Transmittance, Dielectrics

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