Prof. Shuji Hasegawa
at Univ of Tokyo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 January 2008 Paper
Shuji Hasegawa, Shinya Yoshimoto, Rei Hobara
Proceedings Volume 6800, 68000G (2008) https://doi.org/10.1117/12.764823
KEYWORDS: Scanning tunneling microscopy, Scanning electron microscopy, Resistance, Indium, Metals, Nanostructures, Electrodes, Carbon nanotubes, Electron beams, Nanowires

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top