Dr. Shuxian Susan Hu
Senior CAE
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 9 November 2005 Paper
Don Lee, Brian Chu, T.Y. Fang, W.B. Shieh, Susan Hu, Jiunn-Hung Chen, Ray Morgan
Proceedings Volume 5992, 59925D (2005) https://doi.org/10.1117/12.632241
KEYWORDS: Photomasks, Inspection, Semiconducting wafers, Defect inspection, Computer simulations, Optical lithography, Printing, Optical proximity correction, Resolution enhancement technologies, Manufacturing

Proceedings Article | 5 November 2005 Paper
Darren Taylor, Ray Morgan, Susan Hu
Proceedings Volume 5992, 599217 (2005) https://doi.org/10.1117/12.634666
KEYWORDS: Photomasks, Semiconducting wafers, Inspection, Manufacturing, Lithography, Binary data, Reticles, Computer simulations, Phase shifting, Etching

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top