Silvia M. Booij
at Philips Research
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 24 September 2015 Paper
Proc. SPIE. 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
KEYWORDS: Optical design, Reflection, Image processing, Image resolution, Laser ablation, Collimation, Light sources and illumination, Photomasks, Excimer lasers, Tolerancing

Proceedings Article | 12 February 2009 Paper
Proc. SPIE. 7221, Photonics Packaging, Integration, and Interconnects IX
KEYWORDS: Wafer-level optics, Interferometers, Sensors, Gallium arsenide, Silicon, Laser scattering, Lens design, Integrated optics, Vertical cavity surface emitting lasers, Semiconducting wafers

Proceedings Article | 22 December 2003 Paper
Proc. SPIE. 5180, Optical Manufacturing and Testing V
KEYWORDS: Polishing, Microfluidics, Particles, Surface roughness, Computer simulations, Plasma etching, Abrasives, Silicon carbide, Glass processing, Surface finishing

Proceedings Article | 22 December 2003 Paper
Proc. SPIE. 5180, Optical Manufacturing and Testing V
KEYWORDS: Oxides, Polishing, Reflection, Scattering, Calibration, Glasses, Microscopy, Light scattering, Cerium, Surface finishing

SPIE Journal Paper | 1 August 2002
OE Vol. 41 Issue 08
KEYWORDS: Particles, Abrasives, Polishing, Silicon carbide, Surface finishing, Materials processing, Optical engineering, Optical fabrication, Glasses, Surface roughness

Showing 5 of 8 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top