Sina Jahanabin
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 September 2009 Paper
Proceedings Volume 7432, 74320A (2009) https://doi.org/10.1117/12.825194
KEYWORDS: Inspection, Wavelets, Feature extraction, Visualization, LabVIEW, Optical inspection, Image filtering, Image processing, Electronic filtering, Machine vision

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