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Sina Jahanabin

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Proceedings Article | 10 September 2009 Paper

Automatic inspection of textured surfaces by support vector machines

Sina Jahanbin, Alan Bovik, Eduardo Pérez, Dinesh Nair

Proceedings Volume 7432, 74320A (2009) https://doi.org/10.1117/12.825194

KEYWORDS: Inspection, Wavelets, Feature extraction, Visualization, LabVIEW, Optical inspection, Image filtering, Image processing, Electronic filtering, Machine vision

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Automatic inspection of manufactured products with natural looking textures is a challenging task. Products such as tiles, textile, leather, and lumber project image textures that cannot be modeled as periodic or otherwise regular; therefore, a stochastic modeling of local intensity distribution is required. An inspection system to replace human inspectors should be flexible in detecting flaws such as scratches, cracks, and stains occurring in various shapes and sizes that have never been seen before. A computer vision algorithm is proposed in this paper that extracts local statistical features from grey-level texture images decomposed with wavelet frames into subbands of various orientations and scales. The local features extracted are second order statistics derived from grey-level co-occurrence matrices. Subsequently, a support vector machine (SVM) classifier is trained to learn a general description of normal texture from defect-free samples. This algorithm is implemented in LabVIEW and is capable of processing natural texture images in real-time.

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