Prof. Sören Hirsch Profile

Prof. Sören Hirsch

Professor at Otto von Guericke Univ Magdeburg

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Author

Publications (5)

Proceedings Article | 20 February 2017 Paper

Laser surface modification of ZnO for solar converters

Alexey Iakovlev, Dmitriy Redka, Valentin Afanasjev, Nikolay Mukhin, Alexsandr Grishkanich, Evgeniy Terukov, Sören Hirsch

Proceedings Volume 10091, 100911B (2017) https://doi.org/10.1117/12.2253666

KEYWORDS: Zinc oxide, Argon, Solar cells, Photovoltaics, Laser applications, Chemical vapor deposition, Annealing, Glasses, Solar energy, Pulsed laser operation, Phonons, Raman spectroscopy, Crystals, Electrodes

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Proceedings Article | 21 April 2016 Paper

Peculiarities of structure formation of layered metal-oxide system Ti-Ta-(Ti,Ta)xOy during electro-spark alloying and thermally stimulated modification

Marina Fomina, Vladimir Koshuro, Aleksandr Fomin, Igor Rodionov, Aleksandr Skaptsov, Andrey Zakharevich, Alexander Aman, Aleksandr Oseev, Soeren Hirsch, Soeren Majcherek

Proceedings Volume 9917, 99171M (2016) https://doi.org/10.1117/12.2229491

KEYWORDS: Tantalum, Coating, Oxidation, Titanium, Oxides, Crystals, Metals, Oxygen, Nanostructures, Heat treatments, Chemical analysis

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Proceedings Article | 21 May 2015 Paper

Technology towards a SAW based phononic crystal sensor

Marc-Peter Schmidt, Aleksandr Oseev, Ralf Lucklum, Soeren Hirsch

Proceedings Volume 9517, 95170F (2015) https://doi.org/10.1117/12.2178810

KEYWORDS: Etching, Crystals, Photomasks, Sensors, Quartz, Semiconducting wafers, Nickel, Glasses, Metals, Acoustics

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Proceedings Article | 9 April 2010 Paper

A MEMS based measurement system for structure health monitoring applications

Soeren Majcherek, Soeren Hirsch, Bertram Schmidt

Proceedings Volume 7650, 76501R (2010) https://doi.org/10.1117/12.846736

KEYWORDS: Resistors, Silicon, Resistance, Microelectromechanical systems, Semiconducting wafers, Manufacturing, Sensors, Etching, Polymers, Crystals

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Proceedings Article | 31 March 2006 Paper

A new device for characterization of mechanical stress caused by packaging processes

Soeren Hirsch, Bertram Schmidt

Proceedings Volume 6172, 617210 (2006) https://doi.org/10.1117/12.659423

KEYWORDS: Silicon, Etching, Packaging, Microelectromechanical systems, Resistors, Finite element methods, Sensors, Anisotropic etching, Reliability, Resistance

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