Dr. Spyridon Galis (Academic: Spyros Gallis)) is a professor in the SUNY Polytechnic Institute (College of Nanoscale Science and Engineering (CNSE)). He was a senior engineer/ scientist at International Business Machines (IBM) Microelectronics’ Semiconductor Research and Development Center (SRDC) (2006 – 2014). He received his Ph.D. degree in Nanoscale Science from SUNY Albany (New York) in 2006. His primary academic research interests are the design, synthesis and characterization of nanomaterials and nanostructured systems and devices, in addition to the development of photonic and optoelectronic systems for Si-based nano- photonics and biophotonics. Concurrently, his semiconductor-related research focuses are the advanced CMOS chip process integration and characterization, as well as physical failure analysis (PFA) and the development of defect localization methodologies for CMOS technologies. He has a strong grasp of the tools, methodologies and characterization used in thin-film deposition science and technology. He has become a recognized expert in his fields (PFA, silicon oxycarbide and rare-earth oxide related materials) and has served as paper reviewer for several journals.
Study of the effects of structural properties on the photoluminescence behavior of erbium thin films
A comparative study of a-SiCxOyHz thin films grown via chemical vapor deposition for silicon photonics
Strong photoluminescence at 1540 nm from Er-doped amorphous silicon oxycarbide: a novel silicon material for photonic applications