Sri-Kaushik Pavani
at Texas Tech Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 May 2004 Paper
Proc. SPIE. 5303, Machine Vision Applications in Industrial Inspection XII
KEYWORDS: Signal attenuation, Image segmentation, Image processing, Particles, X-rays, Tomography, Image classification, X-ray imaging, Fuzzy logic, 3D image processing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top