Srijan Ray
at Johns Hopkins Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 March 2024 Poster + Paper
Proceedings Volume 12852, 128520H (2024) https://doi.org/10.1117/12.3002172
KEYWORDS: Deep learning, Cancer, Resistance, Phase imaging, Feature extraction, Diagnostics, Optical tomography, Machine learning

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